"Failure analysis of transmission devices using learning vector quantization."

Bingchen Wang, Sigeru Omatu, Toshiro Abe (2003)

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DOI: 10.1109/CIRA.2003.1222293

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-15

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Bingchen Wang, Sigeru Omatu, Toshiro Abe:
Failure analysis of transmission devices using learning vector quantization. CIRA 2003: 864-869

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