"Segmentation of digital microscopy data for the analysis of defect ..."

Landis M. Huffman, Jeff P. Simmons, Ilya Pollak (2008)

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DOI: 10.1117/12.777232

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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Landis M. Huffman, Jeff P. Simmons, Ilya Pollak:
Segmentation of digital microscopy data for the analysis of defect structures in materials using nonlinear diffusions. Computational Imaging 2008: 68140

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