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"Improving SRAM Vmin and yield by using variation-aware BTI stress."
Jiajing Wang et al. (2010)
- Jiajing Wang, Satyanand Nalam, Zhenyu Qi, Randy W. Mann, Mircea R. Stan, Benton H. Calhoun:
Improving SRAM Vmin and yield by using variation-aware BTI stress. CICC 2010: 1-4
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