"A Novel Monitoring Method of RF Characteristics Variations for ..."

Akira Tanabe, Ken'ichiro Hijioka, Yoshihiro Hayashi (2006)

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DOI: 10.1109/CICC.2006.320925

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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Akira Tanabe, Ken'ichiro Hijioka, Yoshihiro Hayashi:
A Novel Monitoring Method of RF Characteristics Variations for Sub-0.1μm MOSFETs with Precise Gate-resistance Model. CICC 2006: 725-728

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