"Measurements of the silicon die characteristics of packaged drivers for ..."

Gerry Talbot, Edoardo Prete (2008)

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DOI: 10.1109/CICC.2008.4672016

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Gerry Talbot, Edoardo Prete:
Measurements of the silicon die characteristics of packaged drivers for high-speed I/O. CICC 2008: 41-48

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