"Analysis of deviation from Pelgrom scaling law in Vth variability of ..."

Kiyohiko Sakakibara et al. (2013)

> Home

Details and statistics

DOI: 10.1109/CICC.2013.6658513

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/cicc/SakakibaraMKT13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/cicc/SakakibaraMKT13
Kiyohiko Sakakibara, Yaichiro Miura, Toshio Kumamoto, Susumu Tanimoto:
Analysis of deviation from Pelgrom scaling law in Vth variability of pocket-implanted MOSFET. CICC 2013: 1-4

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.