"Performance, metastability and soft-error robustness tradeoffs for ..."

David Rennie et al. (2011)

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DOI: 10.1109/CICC.2011.6055415

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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David Rennie, David Li, Manoj Sachdev, Bharat L. Bhuva, Srikanth Jagannathan, Shi-Jie Wen, Rick Wong:
Performance, metastability and soft-error robustness tradeoffs for flip-flops in 40nm CMOS. CICC 2011: 1-4

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