"Simulation and analysis of inductive impact on VLSI interconnects in the ..."

Xiaoning Qi et al. (2005)

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DOI: 10.1109/CICC.2005.1568667

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Xiaoning Qi, Sam C. Lo, Yansheng Luo, Alex Gyure, Mahmoud Shahram, Kishore Singhal:
Simulation and analysis of inductive impact on VLSI interconnects in the presence of process variations. CICC 2005: 309-312

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