"Electrical and photonic I/O test and debug."

Mike Peng Li, Takahiro J. Yamaguchi (2013)

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DOI: 10.1109/CICC.2013.6658558

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Mike Peng Li, Takahiro J. Yamaguchi:
Electrical and photonic I/O test and debug. CICC 2013: 1-2

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