"A 16nm configurable pass-gate bit-cell register file for quantifying the ..."

Jihoon Jeong et al. (2015)

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DOI: 10.1109/CICC.2015.7338444

access: closed

type: Conference or Workshop Paper

metadata version: 2021-04-09

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Jihoon Jeong, Francois Atallah, Hoan Nguyen, Josh Puckett, Keith A. Bowman, David Hansquine:
A 16nm configurable pass-gate bit-cell register file for quantifying the VMIN advantage of PFET versus NFET pass-gate bit cells. CICC 2015: 1-4

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