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"Within-die gate delay variability measurement using re-configurable ring ..."
Bishnu Prasad Das et al. (2008)
- Bishnu Prasad Das, Bharadwaj Amrutur, H. S. Jamadagni, N. V. Arvind, V. Visvanathan:
Within-die gate delay variability measurement using re-configurable ring oscillator. CICC 2008: 133-136

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