"Strain for CMOS performance improvement."

Victor Chan et al. (2005)

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DOI: 10.1109/CICC.2005.1568758

access: closed

type: Conference or Workshop Paper

metadata version: 2021-11-15

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Victor Chan, Ken Rim, Meikei Ieong, Sam Yang, Rajeev Malik, Young Way Teh, Min Yang, Qiqing Ouyang:
Strain for CMOS performance improvement. CICC 2005: 667-674

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