"Modeling and simulation of transistor and circuit variability and reliability."

Asen Asenov et al. (2010)

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DOI: 10.1109/CICC.2010.5617627

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Asen Asenov, Binjie Cheng, Daryoosh Dideban, Urban Kovac, Negin Moezi, Campbell Millar, Gareth Roy, Andrew R. Brown, Scott Roy:
Modeling and simulation of transistor and circuit variability and reliability. CICC 2010: 1-8

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