"Leakage-Resilient Circuit Garbling."

Ruiyang Li et al. (2024)

> Home

Details and statistics

DOI: 10.1145/3658644.3690204

access: closed

type: Conference or Workshop Paper

metadata version: 2024-12-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/ccs/LiS0S0024
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ccs/LiS0S0024
Ruiyang Li, Yiteng Sun, Chun Guo, François-Xavier Standaert, Weijia Wang, Xiao Wang:
Leakage-Resilient Circuit Garbling. CCS 2024: 780-794

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.