"Defect trigger model: Analysis method of mobile application defect."

Dian Lei et al. (2016)

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DOI: 10.1109/CCIS.2016.7790227

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-04

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Dian Lei, Yang Liu, Chengze Li, Jieming Gu, Qi Li:
Defect trigger model: Analysis method of mobile application defect. CCIS 2016: 72-76

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