"Software Defect Content Estimation: A Bayesian Approach."

Achin Jain et al. (2006)

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DOI: 10.1109/CCECE.2006.277482

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Achin Jain, Alok R. Patnaik, Pulak Dhar, Vineet Srivastava:
Software Defect Content Estimation: A Bayesian Approach. CCECE 2006: 2449-2454

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