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"Electromigration testing of wire bonds."

Michael Hook, Di Erick Xu, Michael Mayer (2014)

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DOI: 10.1109/CCECE.2014.6901111

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Michael Hook, Di Erick Xu, Michael Mayer:
Electromigration testing of wire bonds. CCECE 2014: 1-6

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