"A secure collaborative e-diagnostics framework for semiconductor factories."

Min-Hsiung Hung et al. (2005)

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DOI: 10.1109/COASE.2005.1506766

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-19

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Min-Hsiung Hung, Feng-Yi Hsu, Tsung-Li Wang, Fan-Tien Cheng, Robin Lai, Tina Huang:
A secure collaborative e-diagnostics framework for semiconductor factories. CASE 2005: 185-190

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