"Automatic Test Generation on a (U)SIM Smart Card."

Céline Bigot et al. (2006)

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DOI: 10.1007/11733447_25

access: open

type: Conference or Workshop Paper

metadata version: 2018-06-26

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  - conf/cardis/BigotFGS06
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Céline Bigot, Alain Faivre, Christophe Gaston, Julien Simon:
Automatic Test Generation on a (U)SIM Smart Card. CARDIS 2006: 345-358

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