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"SEM Image Analysis for Quality Control of Nanoparticles."
Simon K. Alexander et al. (2009)
- Simon K. Alexander, Robert Azencott, Bernhard G. Bodmann, Ali Bouamrani, Ciro Chiappini, Mauro Ferrari, X. Liu, Ennio Tasciotti:
SEM Image Analysis for Quality Control of Nanoparticles. CAIP 2009: 590-597
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