"8th IEEE International Conference on Biometrics Theory, Applications and ..."

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type: Editorship

metadata version: 2019-10-16

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8th IEEE International Conference on Biometrics Theory, Applications and Systems, BTAS 2016, Niagara Falls, NY, USA, September 6-9, 2016. IEEE 2016, ISBN 978-1-4673-9733-9 [contents]

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