"Mixed supervision model applied to industrial defect detection with mask ..."

Zikang Wang et al. (2023)

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DOI: 10.1109/CISP-BMEI60920.2023.10373375

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type: Conference or Workshop Paper

metadata version: 2024-01-16

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Zikang Wang, Jinzheng Lu, Mingcan Chen, Weidong Tan:
Mixed supervision model applied to industrial defect detection with mask convolutional enhancement. CISP-BMEI 2023: 1-7

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