"Regression Yield Analysis for Semiconductor Manufacturing Based on ..."

Youjin Lee, Yonghan Roh (2022)

> Home

Details and statistics

DOI: 10.1109/BIGDATA55660.2022.10020526

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-18

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/bigdataconf/LeeR22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/bigdataconf/LeeR22
Youjin Lee, Yonghan Roh:
Regression Yield Analysis for Semiconductor Manufacturing Based on Fabrication Conditions. IEEE Big Data 2022: 6747-6748

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.