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"Residue-based Label Protection Mechanisms in Vertical Logistic Regression."

Juntao Tan et al. (2022)

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DOI: 10.1109/BIGCOM57025.2022.00051

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-08

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  dblp key:
  - conf/bigcom/TanZLLW22
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  - https://dblp.org/rec/conf/bigcom/TanZLLW22
Juntao Tan, Lan Zhang, Yang Liu, Anran Li, Ye Wu:
Residue-based Label Protection Mechanisms in Vertical Logistic Regression. BigCom 2022: 356-364

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