"Optimization of testing for complex digital devices."

Evgeny F. Berezkin, Svetlana A. Krasnikova, Victor B. Shuvalov (2020)

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DOI: 10.1016/J.PROCS.2021.06.010

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-10

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Evgeny F. Berezkin, Svetlana A. Krasnikova, Victor B. Shuvalov:
Optimization of testing for complex digital devices. BICA*AI 2020: 82-89

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