"Improved Electrical Reliability and Performance Enhancements in SiGe HBTs ..."

Nelson Sepúlveda-Ramos et al. (2022)

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DOI: 10.1109/BCICTS53451.2022.10051752

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-21

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Nelson Sepúlveda-Ramos, Jeffrey W. Teng, Harrison Lee, John D. Cressler:
Improved Electrical Reliability and Performance Enhancements in SiGe HBTs Using Dummy BEOL Metal Layers. BCICTS 2022: 62-65

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