"Using Pulsed-Mode Measurements of SiGe HBTs for Non-Destructive, Improved ..."

Nelson Sepúlveda-Ramos et al. (2024)

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DOI: 10.1109/BCICTS59662.2024.10745702

access: closed

type: Conference or Workshop Paper

metadata version: 2024-11-28

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Nelson Sepúlveda-Ramos, Harrison P. Lee, Jeffrey W. Teng, John D. Cressler:
Using Pulsed-Mode Measurements of SiGe HBTs for Non-Destructive, Improved RF-SOA Estimation. BCICTS 2024: 286-289

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