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"Reliability Differences Between SiGe HBTs Optimized for High-Performance ..."

Rafael Perez Martinez et al. (2019)

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DOI: 10.1109/BCICTS45179.2019.8972746

access: closed

type: Conference or Workshop Paper

metadata version: 2021-04-16

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Rafael Perez Martinez, Uppili S. Raghunathan, Brian R. Wier, Harrison P. Lee, John D. Cressler:
Reliability Differences Between SiGe HBTs Optimized for High-Performance and Medium-Breakdown. BCICTS 2019: 1-4

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