"Characterization of ScAlN/GaN Toward Electronic Device Application."

Takuya Maeda, Yusuke Wakamoto, Atsushi Kobayashi (2024)

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DOI: 10.1109/BCICTS59662.2024.10745675

access: closed

type: Conference or Workshop Paper

metadata version: 2024-11-28

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Takuya Maeda, Yusuke Wakamoto, Atsushi Kobayashi:
Characterization of ScAlN/GaN Toward Electronic Device Application. BCICTS 2024: 1-4

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