"High Temperature Annealing induced recovery of Hot-Carrier degradation in ..."

Dimitris P. Ioannou, Adam W. DiVergilio (2024)

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DOI: 10.1109/BCICTS59662.2024.10745709

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type: Conference or Workshop Paper

metadata version: 2024-11-28

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Dimitris P. Ioannou, Adam W. DiVergilio:
High Temperature Annealing induced recovery of Hot-Carrier degradation in High Performance NPN SiGe HBTs. BCICTS 2024: 270-273

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