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"Automated Technology for Verification and Analysis, Third International ..."

Doron A. Peled, Yih-Kuen Tsay (2005)

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DOI: 10.1007/11562948

access: closed

type: Editorship

metadata version: 2019-05-14

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Doron A. Peled, Yih-Kuen Tsay:
Automated Technology for Verification and Analysis, Third International Symposium, ATVA 2005, Taipei, Taiwan, October 4-7, 2005, Proceedings. Lecture Notes in Computer Science 3707, Springer 2005, ISBN 3-540-29209-8 [contents]

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