"Identifying Non-Robust Untestable RTL Paths in Circuits with Multi-cycle ..."

Thomas Edison Yu et al. (2008)

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DOI: 10.1109/ATS.2008.55

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Thomas Edison Yu, Tomokazu Yoneda, Satoshi Ohtake, Hideo Fujiwara:
Identifying Non-Robust Untestable RTL Paths in Circuits with Multi-cycle Paths. ATS 2008: 125-130

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