"Weighted Pseudo-Random BIST for N-Detection of Single Stuck-at Faults."

Chaowen Yu, Sudhakar M. Reddy, Irith Pomeranz (2004)

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DOI: 10.1109/ATS.2004.89

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Chaowen Yu, Sudhakar M. Reddy, Irith Pomeranz:
Weighted Pseudo-Random BIST for N-Detection of Single Stuck-at Faults. Asian Test Symposium 2004: 178-183

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