"Design for Testability Based on Single-Port-Change Delay Testing for Data ..."

Yuki Yoshikawa et al. (2005)

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DOI: 10.1109/ATS.2005.47

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Yuki Yoshikawa, Satoshi Ohtake, Michiko Inoue, Hideo Fujiwara:
Design for Testability Based on Single-Port-Change Delay Testing for Data Paths. Asian Test Symposium 2005: 254-259

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