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"Design for Testability Based on Single-Port-Change Delay Testing for Data ..."
Yuki Yoshikawa et al. (2005)
- Yuki Yoshikawa, Satoshi Ohtake, Michiko Inoue, Hideo Fujiwara:
Design for Testability Based on Single-Port-Change Delay Testing for Data Paths. Asian Test Symposium 2005: 254-259
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