"An Approach to Improve the Resolution of Defect-Based Diagnosis."

Iwao Yamazaki et al. (2001)

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DOI: 10.1109/ATS.2001.990270

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Iwao Yamazaki, Hiroki Yamanaka, Toshio Ikeda, Masahiro Takakura, Yasuo Sato:
An Approach to Improve the Resolution of Defect-Based Diagnosis. Asian Test Symposium 2001: 123-

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