"Design for Cost Effective Scan Testing by Reconfiguring Scan Flip-Flops."

Dong Xiang, Kaiwei Li, Hideo Fujiwara (2005)

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DOI: 10.1109/ATS.2005.46

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Dong Xiang, Kaiwei Li, Hideo Fujiwara:
Design for Cost Effective Scan Testing by Reconfiguring Scan Flip-Flops. Asian Test Symposium 2005: 318-323

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