"Improving Test Quality of Scan-Based BIST by Scan Chain Partitioning."

Dong Xiang et al. (2003)

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DOI: 10.1109/ATS.2003.1250774

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Dong Xiang, Ming-Jing Chen, Jia-Guang Sun, Hideo Fujiwara:
Improving Test Quality of Scan-Based BIST by Scan Chain Partitioning. Asian Test Symposium 2003: 12-17

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