"Scan Testing for Complete Coverage of Path Delay Faults with Reduced Test ..."

Dong Xiang et al. (2007)

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DOI: 10.1109/ATS.2007.20

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-09

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Dong Xiang, Krishnendu Chakrabarty, Dianwei Hu, Hideo Fujiwara:
Scan Testing for Complete Coverage of Path Delay Faults with Reduced Test Data Volume, Test Application Time, and Hardware Cost. ATS 2007: 329-334

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