"Accelerated test pattern generators for mixed-mode BIST environments."

Wei-Lun Wang, Kuen-Jong Lee (2000)

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DOI: 10.1109/ATS.2000.893651

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Wei-Lun Wang, Kuen-Jong Lee:
Accelerated test pattern generators for mixed-mode BIST environments. Asian Test Symposium 2000: 368-373

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