"On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST."

Akihiro Tomita et al. (2013)

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DOI: 10.1109/ATS.2013.14

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Akihiro Tomita, Xiaoqing Wen, Yasuo Sato, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor, Laung-Terng Wang:
On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST. Asian Test Symposium 2013: 19-24

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