"Generation of tenacious tests for small gate delay faults in combinational ..."

Hiroshi Takahashi, Takashi Watanabe, Yuzo Takamatsu (1995)

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DOI: 10.1109/ATS.1995.485357

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Hiroshi Takahashi, Takashi Watanabe, Yuzo Takamatsu:
Generation of tenacious tests for small gate delay faults in combinational circuits. Asian Test Symposium 1995: 332-338

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