"Between-Core Vector Overlapping for Test Cost Reduction in Core Testing."

Tsuyoshi Shinogi et al. (2003)

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DOI: 10.1109/ATS.2003.1250821

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Tsuyoshi Shinogi, Yuki Yamada, Terumine Hayashi, Tomohiro Yoshikawa, Shinji Tsuruoka:
Between-Core Vector Overlapping for Test Cost Reduction in Core Testing. Asian Test Symposium 2003: 268-273

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