"A Parallel Generation System of Compact IDDQ Test Sets for Large ..."

Tsuyoshi Shinogi, Terumine Hayashi (1999)

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DOI: 10.1109/ATS.1999.810746

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Tsuyoshi Shinogi, Terumine Hayashi:
A Parallel Generation System of Compact IDDQ Test Sets for Large Combinational Circuits. Asian Test Symposium 1999: 164-

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