default search action
"A Partitioning and Storage Based Built-In Test Pattern Generation Method ..."
Irith Pomeranz, Sudhakar M. Reddy (2002)
- Irith Pomeranz, Sudhakar M. Reddy:
A Partitioning and Storage Based Built-In Test Pattern Generation Method for Delay Faults in Scan Circuits. Asian Test Symposium 2002: 110-115
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.