"A Diagnostic Test Generation Procedure for Combinational Circuits Based on ..."

Irith Pomeranz, W. Kent Fuchs (1998)

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DOI: 10.1109/ATS.1998.741661

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Irith Pomeranz, W. Kent Fuchs:
A Diagnostic Test Generation Procedure for Combinational Circuits Based on Test Elimination. Asian Test Symposium 1998: 486-491

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