"A Family of Logical Fault Models for Reversible Circuits."

Ilia Polian et al. (2005)

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DOI: 10.1109/ATS.2005.9

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Ilia Polian, Thomas Fiehn, Bernd Becker, John P. Hayes:
A Family of Logical Fault Models for Reversible Circuits. Asian Test Symposium 2005: 422-427

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