"IDDQ Test Challenges in Nanotechnologies: A Manufacturing Test Strategy."

Yu Wei P'ng et al. (2007)

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DOI: 10.1109/ATS.2007.36

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-09

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Yu Wei P'ng, Moo Kit Lee, Peng Weng Ng, Chin Hu Ong:
IDDQ Test Challenges in Nanotechnologies: A Manufacturing Test Strategy. ATS 2007: 211

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