"On Flip-Flop Selection for Multi-cycle Scan Test with Partial Observation ..."

Shigeyuki Oshima et al. (2018)

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DOI: 10.1109/ATS.2018.00017

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Shigeyuki Oshima, Takaaki Kato, Senling Wang, Yasuo Sato, Seiji Kajihara:
On Flip-Flop Selection for Multi-cycle Scan Test with Partial Observation in Logic BIST. ATS 2018: 30-35

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