"An Application of Partial Scan Techniques to a High-End System LSI Design."

Toshinobu Ono et al. (2001)

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DOI: 10.1109/ATS.2001.990329

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Toshinobu Ono, Akira Kozawa, Takashi Kimura, Yoshihiro Konno, Koji Saga:
An Application of Partial Scan Techniques to a High-End System LSI Design. Asian Test Symposium 2001: 459

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