"A Non-Scan DFT Method for Controllers to Achieve Complete Fault Efficiency."

Satoshi Ohtake, Toshimitsu Masuzawa, Hideo Fujiwara (1998)

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DOI: 10.1109/ATS.1998.741615

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Satoshi Ohtake, Toshimitsu Masuzawa, Hideo Fujiwara:
A Non-Scan DFT Method for Controllers to Achieve Complete Fault Efficiency. Asian Test Symposium 1998: 204-211

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